Don Walko's Publications

• “Adsorption sites of Te on Si(001),”
  P.F. Lyman, D.A. Walko, D.L. Marasco, H.L. Hutchason, M.E. Keeffe, P.A. Montano and M.J. Bedzyk,
  Surface Science 561, 248 (2004).

• “X-ray standing wave imaging of the 1/3 monolayer Sn/Ge(111) surface,”
  J.S. Okasinski, C.-Y. Kim, D.A. Walko, and M.J. Bedzyk,
  Physical Review B Rapid Communications 69, 041401 (2004). PDF

• “Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron x-ray,”
  Y.S. Chu, A. Tkachuk, S. Vogt, P. Ilinski, D.A. Walko, D.C. Mancini, E.M. Dufresne, L. He, and F. Tsui,
  Applied Surface Science 223, 175 (2004).

• “Compositional characterization of combinatorial materials by scanning x-ray fluorescence microscopy using microfocused synchrotron x-ray beam,”
  S. Vogt, Y.S. Chu, A. Tkachuk, P. Ilinski, D.A. Walko, and F. Tsui,
  Applied Surface Science 223, 214 (2004).
  

• “X-ray studies of Si/Ge/Si(001) epitaxial growth with Te as a surfactant,”
  B.P. Tinkham, D.M. Goodner, D.A. Walko, and M.J. Bedyzk,
  Physical Review B 67, 035404 (2003). PDF

• “Direct atomic structure determination of epitaxially grown films: Gd₂O₃ on GaAs(100),”
  M. Sowwan, Y. Yacoby, J. Pitney, R. MacHarrie, M. Hong, J. Cross, D.A. Walko, R. Clarke, R. Pindak, and E.A. Stern,
  Physical Review B 66, 205311 (2002). PDF

• “Energetics of O-induced faceting on Cu(115),”
  D.A. Walko and I.K. Robinson,
  Physical Review B 64, 045412 (2001). PDF

• “Crystal structure assignment for the heavy-fermion superconductor UPt₃,”
  D.A. Walko, J.-I. Hong, T.V. Chandrasekhar Rao, Z. Wawrzak, D.N. Seidman, W.P. Halperin, and M.J. Bedzyk,
  Physical Review B 63, 054522 (2001). PDF

• “X-ray scattering studies of surfactant-mediated epitaxial growth of Si/Ge/Si(001) heterostructures,”
  W. Rodrigues, O. Sakata, T.-L. Lee, D.A. Walko, D.L. Marasco, and M.J. Bedzyk,
  Journal of Applied Physics 88, 2391 (2000). PDF

• “X-ray scattering study of the Ge(001):Te(1x1) surface structure,”
  O. Sakata, P.F. Lyman, B.P. Tinkham, D.A. Walko, D.L. Marasco, T.-L. Lee, and M.J. Bedzyk,
  Physical Review B 61, 16692 (2000). PDF

• “Surface structure of O/Cu(104) facets determined by x-ray diffraction,”
  D.A. Walko and I.K. Robinson,
  Surface Review and Letters 6, 851 (1999). PDF

• “Multiple bonding configurations for Te adsorbed on the Ge(001) surface,”
  P.F. Lyman, D.L. Marasco, D.A. Walko, and M.J. Bedzyk,
  Physical Review B 60, 8704 (1999). PDF

• “Structure of Cu(115): Clean surface and its oxygen-induced facets,”
  D.A. Walko and I.K. Robinson,
  Physical Review B 59, 15446 (1999). PDF

• “Surface structure of alpha-Ga(010)”,
  D. A. Walko, I. K. Robinson, Ch. Grütter, and J. H. Bilgram,
  Physical Review Letters 81, 626 (1998). PDF

• “Refined structure of (√3x√3) Sb/Si(111),”
  Chinkyo Kim, D. A. Walko, and I. K. Robinson,
  Surface Science 388, 242 (1997). PDF

• “Cu island growth on Cu(110),”
  I. K. Robinson, K. L. Whiteaker, and D. A. Walko,
  Physica B 221, 70 (1996). PDF

• “Undulator test of a Bragg reflection elliptical polarizer at ~7.1 keV,”
  S. D. Shastri, K. D. Finkelstein, Qun Shen, B. W. Batterman, and D. A. Walko,
  Review of Scientific Instruments 66, 1581 (1995). PDF

• “Amorphization of Al₂O₃ by ion induced density reduction,”
  E. D. Specht, D. A. Walko, and S. J. Zinkle,
  Nuclear Instruments and Methods in Physics Research B 84 , 323 (1994).

Conference Proceedings

• “Optimal Countrates for Deadtime Corrections,”
  D.A. Walko, D.A. Arms, E.M. Dufresne, and E.C. Landahl,
  in SRI2009: 10th International Conference on Radiation Instrumentation, edited by R. Garrett, I. Gentle, K. Nugent, and S. Wilkins,
  AIP Conference Proceedings 1234, American Institute of Physics, 2010, pp. 849-852.

• “Time-Resolved Research at the Advanced Photon Source Beamline 7-ID,”
  E.M. Dufresne, B. Adams,  D.A. Arms, M. Chollet, E.C. Landahl, Y.L. Li, D.A. Walko, and J. Wang
  in SRI2009: 10th International Conference on Radiation Instrumentation, edited by R. Garrett, I. Gentle, K. Nugent, and S. Wilkins,
  AIP Conference Proceedings 1234, American Institute of Physics, 2010, pp. 177-180.

• “Picosecond time resolved x-ray diffraction measurements of coherent phonons and carrier dynamics at a buried interface,”
  S.H. Lee, D.M. Fritz, Yu-Miin Sheu, R.S. Goldman, Don Walko, Eric Landahl, and D.A. Reis
  2007 Pacific Rom Conference on Lasers and Electro-optics 1-4, 304 (2007).

• “Using 'macro hardware' to integrate EPICS and SPEC,”
  D.A. Walko,
  Nuclear Instruments and Methods in Physics Research A 582, 196 (2007).

• “Ordering and shape tuning of Ge islands on metal-patterned Si,”
  Jeremy T. Robinson, Yifan Cao, Donald Walko, Dohn Arms, J. Alexander Liddle, and Oscar D. Dubon,
  in Group IV Semiconductor Nanostructures, edited by Christophe Delerue, Leonid Tsybeskov, David J. Lockwood, Masakazu Ichikawa, and Anthony W. van Buuren,
  Mater. Res. Soc. Symp. Proc. 958, Warrendale, PA (2007), Paper # 0958-L03-07.

• “Impact of Pressure Regulation of Cryogenic Fluids and EPICS EPID Feedback on the Monochromatic Beam Position Stability of the 7ID Beamline at the Advanced Photon Source,”
  E.M. Dufresne, D.A. Arms, E.C. Landahl, and D.A. Walko,
  in Synchrotron Radiation Instrumentation: Ninth International Conference, edited by Jae-Young Choi and Seungyu Rah,
  AIP Conference Proceedings 879, American Institute of Physics, 2007, pp. 950-953.

• “A Simple Short-range Point-focusing Spatial Filter for Time-resolved X-ray Fluorescence,”
  C. Hoehr, E. Peterson, E. Landahl, D.A. Walko, R.W. Dunford, E.P. Kanter, and L. Young,
  in Synchrotron Radiation Instrumentation: Ninth International Conference, edited by Jae-Young Choi and Seungyu Rah,
  AIP Conference Proceedings 879, American Institute of Physics, 2007, pp. 1226-1229.

• “Imaging and manipulating heterostructure interfaces,”
  R. Clarke, C. Cionca, C. Dorin, B.P. Rodriguez, J.M Millunchik, D.A. Walko, and Y. Yacoby,
  in Nanotechnology II, edited by Paolo Lugli, Laszlo B. Kish, Javier Mateos,
  Proc. SPIE, Vol. 5838, 10 (2005).
  

• “Correlated structural and magnetization reversal studies on epitaxial Ni films grown with molecular beam epitaxy and with sputtering,”
  Zhengdong Zhang, R. A. Lukaszew, C. Cionca, X. Pan, R. Clarke, M. Yeadon, A. Zambano, D. Walko, E. Dufresne, and Suzanne te Velthius,
  Journal of Vacuum Science and Technology A 22, 1868 (2004).

• “Surface and interface studies at APS endstation 5ID-C,”
  D.A. Walko, O. Sakata, P.F. Lyman, T.-L. Lee, B.P. Tinkham,  J.S. Okasinski,  Z. Zhang and M.J. Bedzyk,
  in Synchrotron Radiation Instrumentation: Eighth International Conference, edited by T. Warwick, J. Arthur, H.A. Padmore, and J. Stohr,
  AIP Conference Proceedings 705, American Institute of Physics, 2004, pp. 1166-1169.

• “Diffractometer-control software for Bragg-rod measurements,”
  Y. Yacoby, D.A. Walko, D. Brewe, M. Bretschneider, M. Sowwan, R. Clarke, R. Pindak, and E.A. Stern,
  in Synchrotron Radiation Instrumentation: Eighth International Conference, edited by T. Warwick, J. Arthur, H.A. Padmore, and J. Stohr,
  AIP Conference Proceedings 705, American Institute of Physics, 2004, pp. 1221-1224.

• “Experience with a fluorescence-based beam position monitor at the APS,”
  E.M. Dufresne, J. A. Guzman, S.B. Dieerker, R. Clarke, D.A. Arms, and D.A. Walko,
  in Synchrotron Radiation Instrumentation: Eighth International Conference, edited by T. Warwick, J. Arthur, H.A. Padmore, and J. Stohr,
  AIP Conference Proceedings 705, American Institute of Physics, 2004, pp. 679-682.

• “Direct determination of the stacking order in Gd₂O₃ epi-layers on GaAs,”
  Y. Yacoby, M. Sowwan, R. Pindak, J. Cross, D. Walko, E. Stern, J. Pitney, R. MacHarrie, M. Hong, and R. Clarke,
  Mat. Res. Soc. Symp. Vol. 751, Z.4.5 (2003).
  

• “X-ray analysis of Si/Ge/Si(001) heterolayer structures grown by surfactant mediated epitaxy,”
  B.P. Tinkham, D.M. Goodner, D.A. Walko, and M.J. Bedzyk,
  Mat. Res. Soc. Symp. Vol. 696, 143 (2002).
  

• “Diffuse x-ray scattering study of defects created by keV ion implants in Si,”
  P.J. Partyka, R.S. Averback, K. Nordlund, I.K. Robinson, D. Walko, P. Ehrhart, T. Diaz de la Rubia, and M. Tang,
  Mat. Res. Soc. Symp. Proc. 439, 89 (1997).

• “Density reduction: a mechanism for amorphization at high ion doses,”
  E. D. Specht, D. A. Walko, and S. J. Zinkle,
  Materials Research Society Symposium Proceedings 321, 399 (1994).

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